WH82(Fe and NFe,0-1500um)

• 1. Thickness measurement using both Magnetic Method to measure the non-magnetic coating on a magnetic metal substrate and Eddy Current Method to measure the non-conductive coating on a non-magnetic me
• 2. Automatic identify ferrous and non-ferrous substrate quickly.
• 3. Negative display function to ensure the accuracy of zero point calibration.
• 4. Power voltage indicator.
• Product description: This device is a portable meter. It is capable of measuring coating thickness quickly, precisely and without injury, both for the laboratory and engineering environment.

The device use both Magnetic Method to measure the non-magnetic coating on a magnetic metal substrate and Eddy Current Method to measure the non-conductive coating on a non-magnetic metal substrate.

Magnetic Method (F-type probe)

When the probe contacts the cover layer, the probe and magnetic substrate forms a closed magnetic circuit; Due to the presence of non-magnetic coating, magnetic resistance changes. The thickness of the cover layer can be derived by measuring the change.

Eddy Current Method (NF-type probe)

When the probe contacts the cover layer, the probe and non-magnetic substrate forms Eddy Current and gives feedback to the coil inside the probe.

The thickness of the cover layer can be derived by measuring the feedback.

Technical Data

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